Termin: 30.08.2010 22:00 Uhr - 01.09.2010 22:00 Uhr
Stadt: Dresden, Deutschland

The International CT Symposium Dresden 2010 (31st August – 2nd September 2010) is addressed to experts, current and future users of all aspects of high-resolution computed tomography. The event will be a forum for conversation and discussion about the latest developments in CT technology and analysis methods as well as the future CT technology around the world, addressing research and industry topics, including material science, geology, biomedicine, 3D metrology, sensors and electronics.

The symposium is an opportunity to gain insight into the unique and versatile applications of high-resolution CT for 3D analysis and metrology and to benefit from the knowledge of experienced users.